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  ANALYTICAL TECHNIQUES FOR THE CHARACTERIZATION OF COMPOUND SEMICONDUCTORS

  BASTARD, G. / OPPOLZER, H.

  This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particula...

  $928.00

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