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  • RELIABILITY PREDICTION FROM BURN-IN DATA FIT TO RELIABILITY MODELS
    BERNSTEIN, JOSEPH
    This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconducto...

    $763.00