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  • ATOMIC FORCE MICROSCOPY FOR ENERGY RESEARCH
    ebook
    ATOMIC FORCE MICROSCOPY FOR ENERGY RESEARCH
    CAI SHEN
    Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion...

    $1,600.00

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