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  • NEW APPROACHES TO IMAGE PROCESSING BASED FAILURE ANALYSIS OF NANO-SCALE ULSI DEVICES
    ebook
    NEW APPROACHES TO IMAGE PROCESSING BASED FAILURE ANALYSIS OF NANO-SCALE ULSI DEVICES
    ZALEVSKY, ZEEV / LIVSHITS, PAVEL / GUR, ERAN
    New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature s...

    $636.00

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