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  • DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997
    ebook
    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997
    J. DONEKER
    Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The ...

    $8,400.00

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