Búsqueda de LIBROS DEL AUTOR: laung terng wang

3 resultados

laung terng wang Eliminar filtro Quitar filtros
  • SYSTEM-ON-CHIP TEST ARCHITECTURES: NANOMETER DESIGN FOR TESTABILITY
    WANG, LAUNG-TERNG / STROUD, CHARLES E. / TOUBA, NUR A.
    Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of t...

    $1,042.00

  • VLSI TEST PRINCIPLES AND ARCHITECTURES: DESIGN FOR TESTABILITY
    WANG, LAUNG-TERNG / WU, CHENG-WEN / WEN, XIAOQING
    This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in ot...

    $1,106.00

  • ELECTRONIC DESIGN AUTOMATION
    LAUNG-TERNG WANG
    This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, ...

    $1,276.00