Búsqueda de LIBROS DEL AUTOR: sandeep k goel

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  • TESTING FOR SMALL-DELAY DEFECTS IN NANOSCALE CMOS INTEGRATED CIRCUITS
    SANDEEP K. GOEL
    Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits cove...

    $2,320.00