Búsqueda de LIBROS DEL AUTOR: wang laung terng

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  • SYSTEM-ON-CHIP TEST ARCHITECTURES: NANOMETER DESIGN FOR TESTABILITY
    ebook
    SYSTEM-ON-CHIP TEST ARCHITECTURES: NANOMETER DESIGN FOR TESTABILITY
    WANG, LAUNG-TERNG / STROUD, CHARLES E. / TOUBA, NUR A.
    Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of t...

    $1,042.00

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  • VLSI TEST PRINCIPLES AND ARCHITECTURES: DESIGN FOR TESTABILITY
    ebook
    VLSI TEST PRINCIPLES AND ARCHITECTURES: DESIGN FOR TESTABILITY
    WANG, LAUNG-TERNG / WU, CHENG-WEN / WEN, XIAOQING
    This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in ot...

    $1,106.00

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