Búsqueda de LIBROS DEL AUTOR: wen xiaoqing

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  ebook

  VLSI TEST PRINCIPLES AND ARCHITECTURES: DESIGN FOR TESTABILITY

  WANG, LAUNG-TERNG / WU, CHENG-WEN / WEN, XIAOQING

  This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in ot...

  $1,106.00

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