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  • DIGITAL CIRCUIT TESTING: A GUIDE TO DFT AND OTHER TECHNIQUES
    ebook
    DIGITAL CIRCUIT TESTING: A GUIDE TO DFT AND OTHER TECHNIQUES
    WONG, FRANCIS C.
    Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of ...

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