Name: COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION
Price: 928.00 MXN
Availability: InStock
Author: HEAD, A.K.
ISBN: 9780444601476

COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION

ebook

Editorial:: NORTH HOLLAND
Materia: FISICA
ISBN:: 9780444601476
Páginas:: 410
Formato:: PDF
Idioma:: Inglés
DRM: Si

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Sinopsis

Computed Electron Micrographs And Defect Identification

COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION (ebook)