Progress in Microscopy details the advancement in various areas of microscopy. The title covers the phenomena, techniques, measurements, and equations. The text first details the physical aspects of image formation in microscopy, and then proceeds to tackling phase contrast, interference, and reflected-light microscopy. Next, the selection deals with the geometrical measurements and the measurement of refraction indices, thickness, and slope. The text also covers infra-red and ultra-violet microscopy, microspectroscopy, microspectrophotometry, and chemical microscopy. The book will be of great use to physicists who specializes in optics.
